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金属矿山 ›› 2010, Vol. 39 ›› Issue (2): 84-86.

• 矿物工程 • 上一篇    下一篇

一种测定工业硅中单质硅含量的新方法

胡郑毛,张先飞   

  1. 中钢集团马鞍山矿山研究院有限公司
  • 出版日期:2010-02-15 发布日期:2010-11-09

A New Measuring Method of Single Silicon in the Industrial Silicon

 HU  Zheng-Mao, ZHANG  Xian-Fei   

  1. Sinosteel Maanshan Institute of Mining Research Co., Ltd.
  • Online:2010-02-15 Published:2010-11-09

摘要: 真实反映工业硅产品品质的指标是其单质硅含量,但目前一般采用的分析工业硅硅含量的差减法和氢氟酸直接挥发法不能排除二氧化硅的影响,导致分析结果偏高。为此,建立了联合采用氢氟酸直接挥发法和高氯酸两次脱水法分析工业硅中单质硅含量的新方法。新方法可分别检测出工业硅中单质硅和二氧化硅的含量,对单质硅和二氧化硅的回收率达到99.57%~100.03%,准确度较高,适用于单质硅含量为90.00%~100.00%的工业硅的分析。

关键词: 工业硅, 单质硅, 二氧化硅, 氢氟酸直接挥发法, 高氯酸两次脱水法

Abstract: The true quality index of industrial silicon products is a single silicon content, but both methods of the subtraction and the hydrofluoric acid evaporation methods commonly used can not rule out the direct effect of silicon dioxide, leading to high silicon index. To this end, a new joint of hydrofluoric acid evaporation and perchloric acid dehydration is established to analyze single silicon content in industrial silicon. The new method can detect and recover single silicon and silicon dioxide in industrial silicon up to 99.57% ~ 100.03%. Due to this high accuracy, it is applicable for the analysis of industrial silicon with silicon content of 90.00% ~ 100.00 %.

Key words: Industrial silicon, Silicon, Dioxide silicon, Hydrofluoric acid evaporation, Perchloric acid dehydration