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金属矿山 ›› 2020, Vol. 49 ›› Issue (07): 178-186.

• 机电与自动化 • 上一篇    下一篇

基于STM32的新型X荧光在线品位分析仪的研制与应用

刘志远,程小舟   

  1. 1. 中钢集团马鞍山矿山研究总院股份有限公司,安徽 马鞍山 243000;2. 华唯金属矿产资源高效循环利用国家工程研究中心有限公司,安徽 马鞍山 243000;3. 金属矿山安全与健康国家重点实验室,安徽 马鞍山 243000
  • 出版日期:2020-07-15 发布日期:2020-08-21

Development and Application of a New Type of X-ray Fluorescence Online Grade Analyzer Based on STM32

Liu Zhiyuan,Cheng Xiaozhou   

  1. 1. Sinosteel Maanshan General Institute of Mining Research Co.,Ltd., Maanshan 243000, China;2. National Engineering Research Center of Huawei High Efficiency Cyclic Utilization of Metal Mineral Resources Co., Ltd., Maanshan 243000, China; 3. State Key Laboratory of Safety and Health for Metal Mine, Maanshan 243000, China
  • Online:2020-07-15 Published:2020-08-21

摘要: 矿浆品位的测量一直是选矿行业的研究重点与技术难点,其测量精度的实时在线反馈直接影响了选矿工艺流程自动化控制的效果。为实现对选矿工艺流程中矿浆元素品位更加准确的测量,在上一代有核在线品位分析仪的基础上改进研发了新一代无核X荧光在线品位分析仪。该新型X荧光在线品位分析仪基于STM32F407控制芯片,采用X光管与半导体探测器相结合的测量结构,其技术架构与分析原理是:X光管与半导体探测器组成测量单元,由X光管激发的X射线照射到需要测量的矿浆表面,同时半导体探测器接收矿浆中待测元素被激发出的X特征荧光;主控单元接收处理半导体探测器上传的数据信号,通过串口通讯将所测元素计数率发送给工控机上位软件;最终上位软件调用Matlab数学分析工具同时采用BP神经网络进行数据的建模分析并得出品位数值。绍兴某选矿厂现场工业试验结果表明,相比较于上一代有核品位分析仪,该新型X荧光在线品位分析仪的测量精度与运行稳定性等均有了显著的提高,各项参数均达到了设计要求。

关键词: 品位测量, STM32, X光管, 半导体探测器, 数据建模, BP神经网络

Abstract: Pulp grade measurement has always been the research focus and technical difficulties in mineral processing industry, the accurate measurement of pulp grade with online feedback directly influences the effect of automatic beneficiation process. In order to achieve more accurate measurement of element grade in pulp during ore dressing, the new generation nuclear-free X-ray fluorescence analyzer was modified and developed based on the last generation nuclear online grade analyzer. The new type X-ray fluorescence online grade analyzer is based on STM32F407 control chip and the measurment structure combine the X-ray light pipe and semiconductor detector. Its technical architecture and analysis principle are as follows: X-ray light pipe and semiconductor detector constitute measurement unit, and the X-ray excited by X-ray light pipe irradiates to the surface of the measured slurry. Meanwhile, the semiconductor detector receives the X-ray characteristic fluorescence excited by the measured element in the slurry. The main control unit receives and processes the data signal uploaded by the semiconductor detector, and sends count rate of the measured element to the upper software of industrial computer through serial communication. Finally, upper software calls Matlab mathematical analysis tool and adopts BP neural network for data modeling analysis and grade value acquisition. The field test results of a concentrator in Shaoxing showed that the measurement accuracy and operational stability of the new type of X-ray fluorescence online grade analyzer are significantly improved compared with the previous generation nuclear grade analyzer,and all the parameters meets the design requirements.

Key words: Grade measurement, STM32, X-ray light pipe, Semiconductor detector, Data modeling, BP neural network