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金属矿山 ›› 2024, Vol. 53 ›› Issue (2): 177-.

• 矿物工程 • 上一篇    下一篇

矿物表面解离度分析技术发展综述

康 贺1,2 李 超1 叶小璐3 李国胜1 曹亦俊1   

  1. 1. 郑州大学中原关键金属河南实验室,河南 郑州 450001;2. 郑州大学化工学院,河南 郑州 450001; 3. 矿冶科技集团有限公司,北京 100160
  • 出版日期:2024-02-15 发布日期:2024-04-03
  • 基金资助:
    国家自然科学基金项目(编号:52004248);中原关键金属实验室项目(编号:GJJSGFYQ202327);稀有金属分离与综合利用国家重点实 验室开放基金项目(编号:GK-202301);郑州市协同创新重大专项(编号:21XTZX06027)。

A Review of Development of Mineral Surface Liberation Analysis Technology

KANG He1,2 LI Chao1 YE Xiaolu3 LI Guosheng1 CAO Yijun1   

  1. 1. Zhongyuan Critical Metals Laboratory,Zhengzhou University,Zhengzhou 450001,China;2. School of Chemical Engineering, Zhengzhou University,Zhengzhou 450001,China;3. BGRIMM Technology Group,Beijing 100160,China
  • Online:2024-02-15 Published:2024-04-03

摘要: 矿物解离程度显著影响浮选分离效率,矿物在颗粒表面解离行为的精准解析是实现浮选过程高效调控 的前提。总结了矿物加工领域常见的矿物表面解离度分析方法:基于扫描电子显微镜(SEM)的2D 解离度分析、2D 解离度的体视学修正和3D 解离度分析方法(X 射线显微断层扫描成像技术)。2D 解离度分析方法应用于低解离度 粗粒连生体时存在体视学偏差,并且复杂共伴生颗粒的2D 矿物解离度体视学修正仍面临挑战。2D 解离分析适用于 矿物单体解离或者高度解离的传统浮选处理的细颗粒,而对于矿物解离度较低的粗颗粒,3D 解离度分析不存在体视 学偏差,可提供更准确的表面解离度分析结果。

关键词: 表面解离度 体视学校正 X 射线显微断层扫描(XMT)

Abstract: The degree of mineral liberation has a significant effect on the separation efficiency of flotation,and accurate analysis of the mineral liberation behavior on the particle surface is a prerequisite for efficient control of the flotation process. We summarized the common methods of mineral surface liberation analysis in the field of mineral processing:2D liberation analysis based on scanning electron microscopy (SEM),stereoscopic correction of 2D liberation and 3D liberation analysis methods (X-ray micro tomography). When the 2D liberation analysis method is applied to low liberation coarse composite particle, there is a stereological bias,and the 2D mineral liberation stereological correction of complex associated particles still faces challenges. 2D liberation analysis are suitable for individual or highly liberated particles by traditional flotation,while for coarse particles with low mineral liberation,3D liberation analysis can provide more accurate physical property analysis results without stereological bias.

Key words: degree of surface liberation,stereological correction,X-ray micro tomography (XMT)